This manual explains the signal and analysis method, composition, and analysis method of Scanning Electron Microscope (SEM), using visual materials for a better understanding. It is published for equipment use by providing tips on equipment analysis method, precautions during operation and its utilization. A SEM is a tool that observes a shape or microstructure after receiving the enlarged images of a subject by collecting the signals that occur on the surface of a sample with a defect and displaying their intensity in a 3D image format and analyzes the distribution, quantity, and quality of the components by installing an Energy Dispersive X-ray (EDX) and Wavelength Dispersive X-ray (WDX). It is widely used in observing the micro-structure and shape of small objects in a solid state across almost all industries including metal scrap, ore and fossil, semiconductor device and network quality inspection, polymer and organic matter, and biological samples.

Ⅰ. Equipment overview
1. Basic principles
2. Composition and functions

Ⅱ. Operation of equipment
1. Sample pre-treatment method
2. Analysis method
3. Precautions during operation

Ⅲ. Equipment management
1. Inspection guidelines
2. Maintenance guidelines

Ⅳ. Equipment utilization